Direct observation of delithiation as the origin of analog memristance in LixNbO2

Direct observation of delithiation as the origin of analog memristance in LixNbO2

The discovery of analog LixNbO2 memristors revealed a promising new memristive mechanism wherein the diffusion of Li+ rather than O2− ions enables precise control of the resistive states. However, directly correlating lithium concentration with changes to the electronic structure in active layers re...

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Bibliographic Details
Main Authors: Sebastian A. Howard, Christopher N. Singh, Galo J. Paez, Matthew J. Wahila, Linda W. Wangoh, Shawn Sallis, Keith Tirpak, Yufeng Liang, David Prendergast, Mateusz Zuba, Jatinkumar Rana, Alex Weidenbach, Timothy M. McCrone, Wanli Yang, Tien-Lin Lee, Fanny Rodolakis, William Doolittle, Wei-Cheng Lee, Louis F. J. Piper
Format: Article
Language:English
Published: AIP Publishing LLC 2019-07-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.5108525

Internet

http://dx.doi.org/10.1063/1.5108525

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