Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

Abstract Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images...

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Bibliographic Details
Main Authors: In-Tae Bae, Tomohiro Ichinose, Myung-Geun Han, Yimei Zhu, Shintaro Yasui, Hiroshi Naganuma
Format: Article
Language:English
Published: Nature Publishing Group 2018-01-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-018-19487-8

Internet

https://doi.org/10.1038/s41598-018-19487-8

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