Non-Destructive Sensor-Based Prediction of Maturity and Optimum Harvest Date of Sweet Cherry Fruit

Non-Destructive Sensor-Based Prediction of Maturity and Optimum Harvest Date of Sweet Cherry Fruit

(1) Background: The aim of the study was to use innovative sensor technology for non-destructive determination and prediction of optimum harvest date (OHD), using sweet cherry as a model fruit, based on different ripening parameters. (2) Methods: Two cherry varieties in two growing systems viz. fiel...

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Bibliographic Details
Main Authors: Verena Overbeck, Michaela Schmitz, Michael Blanke
Format: Article
Language:English
Published: MDPI AG 2017-01-01
Series:Sensors
Subjects:
Sweet cherry (Prunus avium L.)
bio-innovation
harvest prediction
maturity index
modeling
NAI
NDVI
nondestructive examination
Online Access:http://www.mdpi.com/1424-8220/17/2/277

Internet

http://www.mdpi.com/1424-8220/17/2/277

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