Micro-Structure Changes Caused by Thermal Evolution in Chalcogenide Ge<sub>x</sub>As<sub>y</sub>Se<sub>1−x−y</sub> Thin Films by In Situ Measurements

Micro-Structure Changes Caused by Thermal Evolution in Chalcogenide Ge<sub>x</sub>As<sub>y</sub>Se<sub>1−x−y</sub> Thin Films by In Situ Measurements

To understand the effects of thermal annealing on the structure of Ge<sub>x</sub>As<sub>y</sub>Se<sub>1−x−y</sub> thin films, the thermal evolution of these films was measured by the in situ X-ray diffraction (XRD) at different temperature (773 K or 1073 K) in a v...

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Bibliographic Details
Main Authors: Xueqiong Su, Yong Pan, Dongwen Gao, Shufeng Li, Jin Wang, Rongping Wang, Li Wang
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Materials
Subjects:
chalcogenide glasses
Ge<sub>x</sub>As<sub>y</sub>Se<sub>1−x−y</sub>
conduction mechanisms
electrical conductivity
Online Access:https://www.mdpi.com/1996-1944/14/10/2572

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https://www.mdpi.com/1996-1944/14/10/2572

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