Micro-Structure Changes Caused by Thermal Evolution in Chalcogenide Ge<sub>x</sub>As<sub>y</sub>Se<sub>1−x−y</sub> Thin Films by In Situ Measurements
To understand the effects of thermal annealing on the structure of Ge<sub>x</sub>As<sub>y</sub>Se<sub>1−x−y</sub> thin films, the thermal evolution of these films was measured by the in situ X-ray diffraction (XRD) at different temperature (773 K or 1073 K) in a v...
Main Authors: | Xueqiong Su, Yong Pan, Dongwen Gao, Shufeng Li, Jin Wang, Rongping Wang, Li Wang |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-05-01
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Series: | Materials |
Subjects: | |
Online Access: | https://www.mdpi.com/1996-1944/14/10/2572 |
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