Self Heating of an Atomic Force Microscope
Atomic force microscopy (AFM) is a sensitive technique susceptible to unwanted influences, such as thermal noise, vibrational noise, etc. Although, tools that protect AFM against external noise have been developed and are widely used, there are still many sources of inherent noise. One of them is se...
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| Format: | Article |
| Language: | English |
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CTU Central Library
2010-01-01
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| Series: | Acta Polytechnica |
| Subjects: | |
| Online Access: | https://ojs.cvut.cz/ojs/index.php/ap/article/view/1141 |