Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films
Transparent conductive IWO/Cu/IWO (W-doped In<sub>2</sub>O<sub>3</sub>) films were deposited on quartz substrates by magnetron sputtering of IWO and Cu in the Ar atmosphere. The X-ray diffraction (XRD) patterns identified the cubic iron−manganese ore crystal structu...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-12-01
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| Series: | Materials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1944/13/1/113 |