Aplicación del método de Rietveld al análisis cuantitativo SiC sinterizado en fase líquida
Accurate X-ray quantitative analysis in SiC-based ceramics is a difficult task owing to the strong overlap among the Bragg reflections of the different polytypes. In relation to this point, the Rietveld method can be used as a powerful tool in order to solve this problem. In this study we have appli...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2000-06-01
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| Series: | Boletín de la Sociedad Española de Cerámica y Vidrio |
| Subjects: | |
| Online Access: | http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/855/884 |