Feature Transformation Network for Few-Shot Learning
Few-shot learning researches to learn a novel concept from a handful of labeled samples. Due to the small amount of training data, deep network has the risk of over-fitting. Although many previous approaches based on metric criterion can make significant progress to tackle this challenge, they not o...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9378516/ |