Morphology and structure of ZIF-8 during crystallisation measured by dynamic angle-resolved second harmonic scattering

Morphology and structure of ZIF-8 during crystallisation measured by dynamic angle-resolved second harmonic scattering

Angle-resolved monitoring of structure parameters during crystal growth is often slow owing to mechanical movements. Here, the authors use second harmonic scattering and Fourier-plane imaging to dynamically monitor size, shape and concentration of ZIF-8 in situ during the growth process.

Bibliographic Details
Main Authors: Stijn Van Cleuvenbergen, Zachary J. Smith, Olivier Deschaume, Carmen Bartic, Sebastian Wachsmann-Hogiu, Thierry Verbiest, Monique A. van der Veen
Format: Article
Language:English
Published: Nature Publishing Group 2018-08-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-018-05713-4

Internet

https://doi.org/10.1038/s41467-018-05713-4

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