Entropy and gravity concepts as new methodological indexes to investigate technological convergence: patent network-based approach.

The volatility and uncertainty in the process of technological developments are growing faster than ever due to rapid technological innovations. Such phenomena result in integration among disparate technology fields. At this point, it is a critical research issue to understand the different roles an...

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Bibliographic Details
Main Authors: Yongrae Cho, Minsung Kim
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2014-01-01
Series:PLoS ONE
Online Access:http://europepmc.org/articles/PMC4051643?pdf=render