On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges
Atomic force microscopy (AFM) is a widely use technique to acquire topographical, mechanical, or electromagnetic properties of surfaces, as well as to induce surface modifications at the micrometer and nanometer scale. Viscoelastic materials, examples of which include many polymers and biological ma...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2020-09-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.11.125 |