Temperature Sensors Integrated into a CMOS Image Sensor

In this work, a novel approach is presented for measuring relative temperature variations inside the pixel array of a CMOS image sensor itself. This approach can give important information when compensation for dark (current) fixed pattern noise (FPN) is needed. The test image sensor consists of pix...

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Bibliographic Details
Main Authors: Accel Abarca, Shuang Xie, Jules Markenhof, Albert Theuwissen
Format: Article
Language:English
Published: MDPI AG 2017-09-01
Series:Proceedings
Subjects:
Online Access:https://www.mdpi.com/2504-3900/1/4/358