Temperature Sensors Integrated into a CMOS Image Sensor
In this work, a novel approach is presented for measuring relative temperature variations inside the pixel array of a CMOS image sensor itself. This approach can give important information when compensation for dark (current) fixed pattern noise (FPN) is needed. The test image sensor consists of pix...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2017-09-01
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Series: | Proceedings |
Subjects: | |
Online Access: | https://www.mdpi.com/2504-3900/1/4/358 |