Measuring nanoscale viscoelastic parameters of cells directly from AFM force-displacement curves

Abstract Force-displacement (F-Z) curves are the most commonly used Atomic Force Microscopy (AFM) mode to measure the local, nanoscale elastic properties of soft materials like living cells. Yet a theoretical framework has been lacking that allows the post-processing of F-Z data to extract their vis...

Full description

Bibliographic Details
Main Authors: Yuri M. Efremov, Wen-Horng Wang, Shana D. Hardy, Robert L. Geahlen, Arvind Raman
Format: Article
Language:English
Published: Nature Publishing Group 2017-05-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-017-01784-3