A New Statistical Method for Maximum Power Estimation in CMOS VLSI Circuits

A New Statistical Method for Maximum Power Estimation in CMOS VLSI Circuits

A method for maximum power estimation in CMOS VLSI circuits is proposed. The method is based on extreme value theory and allows for the calculation of the upper end point of the probability distribution which is followed by the instantaneous power drawn from the supply bus. The main features of the...

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Bibliographic Details
Main Authors: N. E. Evmorfopoulos, J. N. Avaritsiotis
Format: Article
Language:English
Published: Hindawi Limited 2000-01-01
Series:Active and Passive Electronic Components
Subjects:
Maximum power
reliability
CMOS VLSI circuits
statistics
extremes.
Online Access:http://dx.doi.org/10.1155/2000/39526

Internet

http://dx.doi.org/10.1155/2000/39526

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