Efficient Defect Identification via Oxide Memristive Crossbar Array Based Morphological Image Processing

Efficient Defect Identification via Oxide Memristive Crossbar Array Based Morphological Image Processing

Defect identification has been a significant task in various fields to prevent the potential problems caused by imperfection. There is great attention for developing technology to accurately extract defect information from the image using a computing system without human error. However, image analys...

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Bibliographic Details
Main Authors: Hee Sung Lee, Yongmin Baek, Qiubao Lin, Joseph Minsu Chen, Minseong Park, Doeon Lee, Sihwan Kim, Kyusang Lee
Format: Article
Language:English
Published: Wiley 2021-02-01
Series:Advanced Intelligent Systems
Subjects:
artificial intelligence
defect identification
image processing
memristors
oxide thin-film transistors
Online Access:https://doi.org/10.1002/aisy.202000202

Internet

https://doi.org/10.1002/aisy.202000202

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