Recognizing Linear Building Patterns in Topographic Data by Using Two New Indices Based on Delaunay Triangulation
Building pattern recognition is fundamental to a wide range of downstream applications, such as urban landscape evaluation, social analyses, and map generalization. Although many studies have been conducted, there is still a lack of satisfactory results, due to the imprecision of the relative direct...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-04-01
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| Series: | ISPRS International Journal of Geo-Information |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2220-9964/9/4/231 |