A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model

A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model

The increase in the reliability requirements of integrated circuits applied in diverse smart sensing devices and the increase in the cost of test generation and fault simulation have expanded the need for new approaches to estimate signal reliability in logic circuits, which will help trust manageme...

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Bibliographic Details
Main Authors: Jie Xiao, Jianhui Jiang, Xiaoxin Li, Yujiao Huang, Xuhua Yang, Zhanhui Shi, Jungang Lou
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Access
Subjects:
Binary-decimal code
state-vector expansion
matrix reconstruction
extended probabilistic transfer matrix model
circuit reliability (trust)
Online Access:https://ieeexplore.ieee.org/document/8379344/

Internet

https://ieeexplore.ieee.org/document/8379344/

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