Validation of Data-Driven Labeling Approaches Using a Novel Deep Network Structure for Remaining Useful Life Predictions

Today, most research studies that aim to predict the remaining useful life (RUL) of industrial components based on deep learning techniques are using piecewise linear (PwL) run-to-failure targets to model the degradation process. However, this PwL degradation model assumes a constant initial RUL val...

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Bibliographic Details
Main Authors: Andre Listou Ellefsen, Sergey Ushakov, Vilmar Aesoy, Houxiang Zhang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8727535/