Sn tuned microstructure and phase-change characteristics of GeTe nanowires
Sn-doped GeTe (SGT) nanowires (NWs) were investigated systematically for use in phase-change memory (PCM) applications. Composition and microstructure characterizations indicate that SGT with ∼3.0% Sn (SGT_3.0) NWs preserves the GeTe rhombohedral (R) structure, whereas SGT with a Sn content of ∼25.0...
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doaj-4ddcd571a72d4e30b5e7e617872a12ae2020-11-25T03:36:55ZengAIP Publishing LLCAIP Advances2158-32262020-10-011010105228105228-610.1063/5.0027144Sn tuned microstructure and phase-change characteristics of GeTe nanowiresJie Zhang0Hailin Yu1Fenfen Wei2Yaojun Dong3Zhenguang Shao4Yushen Liu5College of Electronic and Information Engineering, Changshu Institute of Technology, Changshu 215500, ChinaCollege of Electronic and Information Engineering, Changshu Institute of Technology, Changshu 215500, ChinaBasic Experimental Teaching Center, Shanxi Normal University, Xi’an 710062, ChinaCollege of Electronic and Information Engineering, Changshu Institute of Technology, Changshu 215500, ChinaCollege of Electronic and Information Engineering, Changshu Institute of Technology, Changshu 215500, ChinaCollege of Electronic and Information Engineering, Changshu Institute of Technology, Changshu 215500, ChinaSn-doped GeTe (SGT) nanowires (NWs) were investigated systematically for use in phase-change memory (PCM) applications. Composition and microstructure characterizations indicate that SGT with ∼3.0% Sn (SGT_3.0) NWs preserves the GeTe rhombohedral (R) structure, whereas SGT with a Sn content of ∼25.0% (SGT_25.0) NWs exhibits a cubic (C) structure. R–C structural conversion of SGT NWs is revealed with increasing Sn content. According to ab initio calculations, optimizing doping leads to a decrease in density of states near the Fermi level and reduces electrical conductivity, and thereby, SGT_3.0 is more applicable for PCM than SGT_25.0, which is attributed to Sn-induced structural change that brings about a diversity in the electrical properties. Experimentally, SGT_3.0 NWs have two significant threshold switchings and ideal high/low resistance ratio (∼105). Compared with undoped GeTe, SGT_3.0 NWs experience an increase in crystalline resistance, in agreement with our theoretical calculations, perfectly satisfying the requirement of low programming currents for PCM.http://dx.doi.org/10.1063/5.0027144 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Jie Zhang Hailin Yu Fenfen Wei Yaojun Dong Zhenguang Shao Yushen Liu |
spellingShingle |
Jie Zhang Hailin Yu Fenfen Wei Yaojun Dong Zhenguang Shao Yushen Liu Sn tuned microstructure and phase-change characteristics of GeTe nanowires AIP Advances |
author_facet |
Jie Zhang Hailin Yu Fenfen Wei Yaojun Dong Zhenguang Shao Yushen Liu |
author_sort |
Jie Zhang |
title |
Sn tuned microstructure and phase-change characteristics of GeTe nanowires |
title_short |
Sn tuned microstructure and phase-change characteristics of GeTe nanowires |
title_full |
Sn tuned microstructure and phase-change characteristics of GeTe nanowires |
title_fullStr |
Sn tuned microstructure and phase-change characteristics of GeTe nanowires |
title_full_unstemmed |
Sn tuned microstructure and phase-change characteristics of GeTe nanowires |
title_sort |
sn tuned microstructure and phase-change characteristics of gete nanowires |
publisher |
AIP Publishing LLC |
series |
AIP Advances |
issn |
2158-3226 |
publishDate |
2020-10-01 |
description |
Sn-doped GeTe (SGT) nanowires (NWs) were investigated systematically for use in phase-change memory (PCM) applications. Composition and microstructure characterizations indicate that SGT with ∼3.0% Sn (SGT_3.0) NWs preserves the GeTe rhombohedral (R) structure, whereas SGT with a Sn content of ∼25.0% (SGT_25.0) NWs exhibits a cubic (C) structure. R–C structural conversion of SGT NWs is revealed with increasing Sn content. According to ab initio calculations, optimizing doping leads to a decrease in density of states near the Fermi level and reduces electrical conductivity, and thereby, SGT_3.0 is more applicable for PCM than SGT_25.0, which is attributed to Sn-induced structural change that brings about a diversity in the electrical properties. Experimentally, SGT_3.0 NWs have two significant threshold switchings and ideal high/low resistance ratio (∼105). Compared with undoped GeTe, SGT_3.0 NWs experience an increase in crystalline resistance, in agreement with our theoretical calculations, perfectly satisfying the requirement of low programming currents for PCM. |
url |
http://dx.doi.org/10.1063/5.0027144 |
work_keys_str_mv |
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