Statistical Leakage Analysis Using Gaussian Mixture Model
In the design process of advanced semiconductor devices, statistical leakage analysis has emerged as a major step due to uncertainties in the leakage current caused by the process variations. In this paper, a novel statistical leakage analysis which uses Gaussian mixture model (GMM) as the density f...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8466761/ |