Influence of Microstructure on Synchrotron X-ray Diffraction Lattice Strain Measurement Uncertainty

Influence of Microstructure on Synchrotron X-ray Diffraction Lattice Strain Measurement Uncertainty

Accurate residual lattice strain measurements are highly dependent upon the precision of the diffraction peak location and the underlying microstructure suitability. The suitability of the microstructure is related to the requirement for valid powder diffraction sampling statistics and the associate...

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Bibliographic Details
Main Authors: Chris A. Simpson, David M. Knowles, Mahmoud Mostafavi
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Metals
Subjects:
synchrotron X-ray diffraction
uncertainty
strain
grain size
monochromatic
energy dispersive
Online Access:https://www.mdpi.com/2075-4701/11/5/774

Internet

https://www.mdpi.com/2075-4701/11/5/774

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