Radiation attenuation properties based on the quantification of soil components using the Rietveld Method
We propose the use of X-ray diffraction associated with Rietveld Method (RM-XRD) for soil components quantification aiming at evaluating photon attenuation parameters (total and partial attenuation coefficients (µ), effective atomic number (Zeff), effective electron density (Nel) and cross-sections...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2019-03-01
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| Series: | Results in Physics |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2211379718331243 |