MEASURING SYSTEMS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS AND CONCEPT OF «A PRIORI INFORMATION ELIMINATION»

MEASURING SYSTEMS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS AND CONCEPT OF «A PRIORI INFORMATION ELIMINATION»

Construction principles of highly effective measuring systems based on two-wavelength semiconductor lasers and the concept «a priori information elimination» are presented. These systems provide advantages before similar one-wavelength laser measuring instruments.

Bibliographic Details
Main Authors: V. L. Kozlov, M. M. Kygeiko
Format: Article
Language:English
Published: Belarusian National Technical University 2015-04-01
Series:Pribory i Metody Izmerenij
Subjects:
two-wavelength semiconductor laser
concept of «a priori information elimination»
laser measuring instruments
Online Access:https://pimi.bntu.by/jour/article/view/92

Internet

https://pimi.bntu.by/jour/article/view/92

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