Temperature effects on the mechanical reliability of MEMS structures: experimental study on creep and thermal fatigue
Main Authors: | Brusa E., Somà A., De Pasquale G. |
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Format: | Article |
Language: | English |
Published: |
EDP Sciences
2010-06-01
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Series: | EPJ Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/epjconf/20100606001 |
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