Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction

Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction

A diffraction-based technique is developed for the determination of three-dimensional nanostructures. The technique employs high-resolution and low-dose scanning electron nanodiffraction (SEND) to acquire three-dimensional diffraction patterns, with the help of a special sample holder for large-angl...

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Bibliographic Details
Main Authors: Yifei Meng, Jian-Min Zuo
Format: Article
Language:English
Published: International Union of Crystallography 2016-09-01
Series:IUCrJ
Subjects:
three-dimensional nanostructure
scanning electron diffraction
diffraction tomography
inorganic materials
nanocrystalline TiN films
crystal morphology
Online Access:http://scripts.iucr.org/cgi-bin/paper?S205225251600943X

Internet

http://scripts.iucr.org/cgi-bin/paper?S205225251600943X

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