Visual in-plane positioning of a Labeled target with subpixel Resolution: basics and application

Visual in-plane positioning of a Labeled target with subpixel Resolution: basics and application

Vision is a convenient tool for position measurements. In this paper, we present several applications in which a reference pattern can be defined on the target for a priori knowledge of image features and further optimization by software. Selecting pseudoperiodic patterns leads to high resolution in...

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Bibliographic Details
Main Authors: Patrick Sandoz, July A. Galeano, Artur Zarzycki, Deivid Botina, Fabián Cortés-Mancera, Andrés Cardona, Laurent Robert
Format: Article
Language:English
Published: Instituto Tecnológico Metropolitano 2017-05-01
Series:TecnoLógicas
Subjects:
Fourier transform phase processing
visual in-plane position measurement
vibration amplitude
shear force microscopy
position referenced microscopy.
Online Access:http://itmojs.itm.edu.co/index.php/tecnologicas/article/view/1047/931

Internet

http://itmojs.itm.edu.co/index.php/tecnologicas/article/view/1047/931

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