Fault Coverage Re-Evaluation of Memory Test Algorithms With Physical Memory Characteristics

A memory fault model (FM) is an abstraction of the physical mechanism of memory failure. When the physical failure mechanisms are not fully represented in FMs, the coverage of the FMs can be different from that of the failure mechanisms. However, it is impractical (or impossible) to model every elec...

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Bibliographic Details
Main Authors: Kiseok Lee, Jeonghwan Kim, Sanghyeon Baeg
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9530424/