Investigation of Silicon Carbide Polytypes by Raman Spectroscopy
Dažādu fāzu silīcija karbīda (SiC) monokristāli, kas audzēti uz SiC pamatnēm ar ķīmiskās nogulsnēšanas metodi no gāzveida fāzes, tika pētīti, izmantojot Ramana spektroskopiju, skenējošo elektronu mikroskopiju (SEM) un rentgenstaru difrakciju (XRD). Ar SEM palīdzību tika identificēti kristalogrāfiskā...
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2014-06-01
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| Series: | Latvian Journal of Physics and Technical Sciences |
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| Online Access: | https://doi.org/10.2478/lpts-2014-0019 |
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doaj-5508bfdd91bc4494b11fda5dc561a8782021-09-06T19:22:26ZengSciendoLatvian Journal of Physics and Technical Sciences0868-82572014-06-01513515710.2478/lpts-2014-0019lpts-2014-0019Investigation of Silicon Carbide Polytypes by Raman SpectroscopyChikvaidze G.0Mironova-Ulmane N.1Plaude A.2Sergeev O.3Institute of Solid State Physics, University of Latvia, 8 Ķengaraga Str., LV-1063, Rīga, LATVIAInstitute of Solid State Physics, University of Latvia, 8 Ķengaraga Str., LV-1063, Rīga, LATVIAInstitute of Solid State Physics, University of Latvia, 8 Ķengaraga Str., LV-1063, Rīga, LATVIAV.E.Lashkaryov Institute of Semiconductor Physics, National Academy of Science of the Ukraine, 41 Nauki Ave., 03028, Kyiv, the UKRAINEDažādu fāzu silīcija karbīda (SiC) monokristāli, kas audzēti uz SiC pamatnēm ar ķīmiskās nogulsnēšanas metodi no gāzveida fāzes, tika pētīti, izmantojot Ramana spektroskopiju, skenējošo elektronu mikroskopiju (SEM) un rentgenstaru difrakciju (XRD). Ar SEM palīdzību tika identificēti kristalogrāfiskās struktūras apgabali un ieslēgumi, ir pierādīts, ka tie korelē ar Ramana spektru pīķu pozīcijām, un XRD datiem par kristālisko struktūruhttps://doi.org/10.2478/lpts-2014-0019silicon carbide (sic)polytypesraman spectroscopyx-ray diffraction (xrd) |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
Chikvaidze G. Mironova-Ulmane N. Plaude A. Sergeev O. |
| spellingShingle |
Chikvaidze G. Mironova-Ulmane N. Plaude A. Sergeev O. Investigation of Silicon Carbide Polytypes by Raman Spectroscopy Latvian Journal of Physics and Technical Sciences silicon carbide (sic) polytypes raman spectroscopy x-ray diffraction (xrd) |
| author_facet |
Chikvaidze G. Mironova-Ulmane N. Plaude A. Sergeev O. |
| author_sort |
Chikvaidze G. |
| title |
Investigation of Silicon Carbide Polytypes by Raman Spectroscopy |
| title_short |
Investigation of Silicon Carbide Polytypes by Raman Spectroscopy |
| title_full |
Investigation of Silicon Carbide Polytypes by Raman Spectroscopy |
| title_fullStr |
Investigation of Silicon Carbide Polytypes by Raman Spectroscopy |
| title_full_unstemmed |
Investigation of Silicon Carbide Polytypes by Raman Spectroscopy |
| title_sort |
investigation of silicon carbide polytypes by raman spectroscopy |
| publisher |
Sciendo |
| series |
Latvian Journal of Physics and Technical Sciences |
| issn |
0868-8257 |
| publishDate |
2014-06-01 |
| description |
Dažādu fāzu silīcija karbīda (SiC) monokristāli, kas audzēti uz SiC pamatnēm ar ķīmiskās nogulsnēšanas metodi no gāzveida fāzes, tika pētīti, izmantojot Ramana spektroskopiju, skenējošo elektronu mikroskopiju (SEM) un rentgenstaru difrakciju (XRD). Ar SEM palīdzību tika identificēti kristalogrāfiskās struktūras apgabali un ieslēgumi, ir pierādīts, ka tie korelē ar Ramana spektru pīķu pozīcijām, un XRD datiem par kristālisko struktūru |
| topic |
silicon carbide (sic) polytypes raman spectroscopy x-ray diffraction (xrd) |
| url |
https://doi.org/10.2478/lpts-2014-0019 |
| work_keys_str_mv |
AT chikvaidzeg investigationofsiliconcarbidepolytypesbyramanspectroscopy AT mironovaulmanen investigationofsiliconcarbidepolytypesbyramanspectroscopy AT plaudea investigationofsiliconcarbidepolytypesbyramanspectroscopy AT sergeevo investigationofsiliconcarbidepolytypesbyramanspectroscopy |
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