Analytical study of substrate parasitic effects in common-base and common-emitter SiGe BHT amplifiers
An analytical study to quantify the substrate parasitic effects on SiGe HBT amplifiers in both common-base and common-emitter configuration is presented. The power gain relations and stability factors are derived from the modelled S-parameters which are computed at a fixed bias point from the small-...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Sociedade Brasileira de Microondas e Optoeletrônica; Sociedade Brasileira de Eletromagnetismo
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Series: | Journal of Microwaves, Optoelectronics and Electromagnetic Applications |
Subjects: | |
Online Access: | http://www.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000100017&lng=en&tlng=en |