Development of the contact detection method in free-form surface of the optical fiber probe for microstructure measurement using long short term memory
We have been developing a measurement system for microstructures using a small-diameter optical fiber probe. The contact detection method using a threshold value may cause a large error due to the time lag between the real contact time and the time detected by the measurement system. In this paper,...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2021-12-01
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| Series: | Measurement: Sensors |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2665917421001331 |