Localization Phenomena in Disordered Tantalum Films
Using dc transport and wide-band spectroscopic ellipsometry techniques we study localization phenomena in highly disordered metallic β -Ta films grown by rf sputtering deposition. The dc transport study implies non-metallic behavior (d ρ /dT < 0), with negative temperature coefficien...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2017-07-01
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| Series: | Metals |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2075-4701/7/7/257 |