Electrostatic force: A novel method for mounting small zircon grains to expose the maximum outer surface
Mirco-beam isotopic analyses of zircon have increased dramatically with applications for providing multi-isotopic information. As small as 2–5 μm spot size could be used by secondary ion mass spectrometry for in-situ isotope analysis of zircon with high precision and accuracy. However, this lateral...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2020-09-01
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| Series: | Solid Earth Sciences |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2451912X20300325 |