Measurement of In-Plane Displacement in Two Orthogonal Directions by Digital Speckle Pattern Interferometry

The measurement of in-plane displacement in two orthogonal directions is of considerable significance for modern industries. This paper reports on a spatial carrier phase-shift digital speckle pattern interferometry (DSPI) for the simultaneous measurement of in-plane displacement in two orthogonal d...

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Bibliographic Details
Main Authors: Peizheng Yan, Xiangwei Liu, Fangyuan Sun, Qihan Zhao, Shimin Zhong, Yonghong Wang
Format: Article
Language:English
Published: MDPI AG 2019-09-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/9/18/3882