X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films

We report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by c...

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Bibliographic Details
Main Authors: L. J. Collins-McIntyre, M. D. Watson, A. A. Baker, S. L. Zhang, A. I. Coldea, S. E. Harrison, A. Pushp, A. J. Kellock, S. S. P. Parkin, G. van der Laan, T. Hesjedal
Format: Article
Language:English
Published: AIP Publishing LLC 2014-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4904900