X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films
We report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by c...
Main Authors: | , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2014-12-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/1.4904900 |