An Image Processing Method for Extraction of the Stress Wave Reflection Period

An Image Processing Method for Extraction of the Stress Wave Reflection Period

The stress wave reflection method is widely used in the detection of structure size and integrity due to its advantages of low environmental impact and convenience. The detection accuracy depends on the accurate extraction of the stress wave reflection period. The traditional peak–peak method (PPM)...

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Bibliographic Details
Main Authors: Panpan Gong, Mingzhang Luo, Luoyu Zhou, Liming Jiang, Xuemin Chen
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Applied Sciences
Subjects:
nondestructive testing (NDT)
feature extraction
stress wave reflection period
image processing
Fourier transform
lead zirconate titanate (PZT)
Online Access:https://www.mdpi.com/2076-3417/10/10/3486

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https://www.mdpi.com/2076-3417/10/10/3486

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