Nanometric Integrated Temperature and Thermal Sensors in CMOS-SOI Technology

Nanometric Integrated Temperature and Thermal Sensors in CMOS-SOI Technology

This paper reviews and compares the thermal and noise characterization of CMOS (complementary metal-oxide-semiconductor) SOI (Silicon on insulator) transistors and lateral diodes used as temperature and thermal sensors. DC analysis of the measured sensors and the experimental results in a broad (300...

Full description

Bibliographic Details
Main Authors: Maria Malits, Yael Nemirovsky
Format: Article
Language:English
Published: MDPI AG 2017-07-01
Series:Sensors
Subjects:
CMOS–SOI
lateral diodes
temperature sensors
thermal sensors
semiconductor devices
Online Access:https://www.mdpi.com/1424-8220/17/8/1739

Internet

https://www.mdpi.com/1424-8220/17/8/1739

Similar Items