Nanometric Integrated Temperature and Thermal Sensors in CMOS-SOI Technology
This paper reviews and compares the thermal and noise characterization of CMOS (complementary metal-oxide-semiconductor) SOI (Silicon on insulator) transistors and lateral diodes used as temperature and thermal sensors. DC analysis of the measured sensors and the experimental results in a broad (300...
Main Authors: | Maria Malits, Yael Nemirovsky |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2017-07-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/17/8/1739 |
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