Determination of phonon decay rate in p-type silicon under Fano resonance by measurement of coherent phonons

We determine phonon decay rate by measuring the temperature dependence of coherent phonons in p-type Si under Fano resonance, where there is interference between the continuum and discrete states. As the temperature decreases, the decay rate of coherent phonons decreases, whereas that evaluated from...

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Bibliographic Details
Main Authors: Keiko Kato, Katsuya Oguri, Haruki Sanada, Takehiko Tawara, Tetsuomi Sogawa, Hideki Gotoh
Format: Article
Language:English
Published: AIP Publishing LLC 2015-09-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4931393