Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
Monitoring growth dynamics of crystalline thin materials progressively is crucial to understand the mechanism. Here, the authors develop a local step flow model to investigate the growth of C60 films on graphene coated over silicon substrates that correlates the step-edge velocity with its terrace l...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2019-06-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-019-10629-8 |