Adversarial Learning for Cross-Project Semi-Supervised Defect Prediction

Adversarial Learning for Cross-Project Semi-Supervised Defect Prediction

Cross-project defect prediction (CPDP) aims to build a prediction model on existing source projects and predict the labels of target project. The data distribution difference between different projects makes CPDP very challenging. Besides, most existing CPDP methods usually require sufficient and la...

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Bibliographic Details
Main Authors: Ying Sun, Xiao-Yuan Jing, Fei Wu, Juanjuan Li, Danlei Xing, Haowen Chen, Yanfei Sun
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Cross-project defect prediction
adversarial learning
semi-supervised learning
Online Access:https://ieeexplore.ieee.org/document/9000866/

Internet

https://ieeexplore.ieee.org/document/9000866/

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