FPGA-Based Acceleration on Additive Manufacturing Defects Inspection

Additive manufacturing (AM) has gained increasing attention over the past years due to its fast prototype, easier modification, and possibility for complex internal texture devices when compared to traditional manufacture processing. However, potential internal defects are occurring during AM proces...

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Bibliographic Details
Main Authors: Yawen Luo, Yuhua Chen
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/6/2123