Modeling and PSPICE simulation of NBTI effects in VDMOS transistors

In this paper the results of modeling and simulation of NBTI effects in p-channel power VDMOS transistor have been presented. Based on the experimental results, the threshold voltage shifts and changes of transconductance during the NBT stress have been modeled and implemented in the PSP...

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Bibliographic Details
Main Authors: Marjanović Miloš, Danković Danijel, Prijić Aneta, Prijić Zoran, Janković Nebojša, Davidović Vojkan
Format: Article
Language:English
Published: Faculty of Technical Sciences in Cacak 2015-01-01
Series:Serbian Journal of Electrical Engineering
Subjects:
Online Access:http://www.doiserbia.nb.rs/img/doi/1451-4869/2015/1451-48691501069M.pdf