Low contact resistance in epitaxial graphene devices for quantum metrology

Low contact resistance in epitaxial graphene devices for quantum metrology

We investigate Ti/Au contacts to monolayer epitaxial graphene on SiC (0001) for applications in quantum resistance metrology. Using three-terminal measurements in the quantum Hall regime we observed variations in contact resistances ranging from a minimal value of 0.6 Ω up to 11 kΩ. We identify a ma...

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Bibliographic Details
Main Authors: Tom Yager, Arseniy Lartsev, Karin Cedergren, Rositsa Yakimova, Vishal Panchal, Olga Kazakova, Alexander Tzalenchuk, Kyung Ho Kim, Yung Woo Park, Samuel Lara-Avila, Sergey Kubatkin
Format: Article
Language:English
Published: AIP Publishing LLC 2015-08-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4928653

Internet

http://dx.doi.org/10.1063/1.4928653

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