METHODS OF FAILURE DIAGNOSTICS OF TANTALUM OXIDE-SEMICONDUCTOR CAPACITORS WITH SOLID DIELECTRIC
The subject of the study is oxide-semiconductor capacitors, which are widely used in the manufacture of electronic equipment. The goal of the study is to determine the main causes of failures of oxide-semiconductor capacitors at the production and operation stages. For this purpose, analogs of flat...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Kharkiv National University of Radio Electronics
2018-12-01
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| Series: | Сучасний стан наукових досліджень та технологій в промисловості |
| Subjects: | |
| Online Access: | https://itssi-journal.com/index.php/ittsi/article/view/93 |