Reliability Assessment for Very Few Failure Data and Weibull Distribution
Only very few failure data can be obtained for the time censored test of high-reliability and long-life products. For very few failure data, the current methods fail to obtain both the point estimation and confidence interval of reliability parameters. If the point estimation and confidence interval...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2019-01-01
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| Series: | Mathematical Problems in Engineering |
| Online Access: | http://dx.doi.org/10.1155/2019/8947905 |