A Threshold Switching Selector Based on Highly Ordered Ag Nanodots for X‐Point Memory Applications

Abstract Leakage interference between memory cells is the primary obstacle for enlarging X‐point memory arrays. Metal‐filament threshold switches, possessing excellent selectivity and low leakage current, are developed in series with memory cells to reduce sneak path current and lower power consumpt...

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Bibliographic Details
Main Authors: Qilin Hua, Huaqiang Wu, Bin Gao, Meiran Zhao, Yujia Li, Xinyi Li, Xiang Hou, Meng‐Fan (Marvin) Chang, Peng Zhou, He Qian
Format: Article
Language:English
Published: Wiley 2019-05-01
Series:Advanced Science
Subjects:
Online Access:https://doi.org/10.1002/advs.201900024