A Finite-Difference Approach for Plasma Microwave Imaging Profilometry
Plasma diagnostics is a topic of great interest in the physics and engineering community because the monitoring of plasma parameters plays a fundamental role in the development and optimization of plasma reactors. Towards this aim, microwave diagnostics, such as reflectometric, interferometric, and...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-08-01
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| Series: | Journal of Imaging |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2313-433X/5/8/70 |