Transfer Learning Based Data Feature Transfer for Fault Diagnosis

The development of sensor technology provides massive data for data-driven fault diagnosis. In recent years, more and more scholars are studying artificial intelligence technology to solve the bottleneck in fault diagnosis. Compared with other classification and prediction problems, fault diagnosis...

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Bibliographic Details
Main Authors: Wei Xu, Yi Wan, Tian-Yu Zuo, Xin-Mei Sha
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9076175/