Survey of VLSI Test Data Compression Methods
It has been seen that the test data compression has been an emerging need of VLSI field and hence the hot topic of research for last decade. Still there is a great need and scope for further reduction in test data volume. This reduction may be lossy for output side test data but must be lossless for...
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| Format: | Article |
| Language: | English |
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Institute of Technology, Nirma University
2000-01-01
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| Series: | Nirma University Journal of Engineering and Technology |
| Online Access: | http://nujet.org.in/index.php/nujet/article/view/84 |